N-SIM E Super-Resolution Microscope from Nikon Instruments Inc.

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Nikon Instruments Inc. for
N-SIM E Super-Resolution Microscope

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Description

Utilizing structured illumination microscopy (SIM) technology, the all-new N-SIM E realizes double the spatial resolution of conventional optical microscopes (to approximately 115 nm in XY and 300 nm in Z). N-SIM E is a streamlined, affordable super-resolution system supporting only essential, commonly used excitation wavelengths and imaging modes, making it an obvious choice for individual labs.